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Extend waiting time in test_attr_access_sd - #3324
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Signed-off-by: Barry Wu <a0987818905@gmail.com>
Signed-off-by: Barry Wu <a0987818905@gmail.com>
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Bito Automatic Review Skipped - Files Excluded |
Signed-off-by: Barry Wu <a0987818905@gmail.com>
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Bito Automatic Review Skipped - Files Excluded |
Signed-off-by: Barry Wu <a0987818905@gmail.com> Signed-off-by: Atharva <atharvakulkarni172003@gmail.com>
Tracking issue
Why are the changes needed?
Recently, the integration test often fail at test_attr_access_sd with user runtime error.
Thus, just extending the waiting time to test whether the integration test pass easily.
What changes were proposed in this pull request?
Extend the waiting time.
How was this patch tested?
Setup process
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Summary by Bito
This pull request extends the waiting time in the integration test for the `test_attr_access_sd` function to reduce frequent test failures caused by user runtime errors. The adjustment aims to enhance the reliability of the integration tests.